Electron Microscopy Analysis of Interfaces in Oxides for...

Electron Microscopy Analysis of Interfaces in Oxides for Energy Applications

Winterstein, JP, Wang, C, Carter, CB
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760909357x
Date:
July, 2009
File:
PDF, 552 KB
english, 2009
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