Development of a 200kV Atomic Resolution Analytical...

Development of a 200kV Atomic Resolution Analytical Electron Microscope

Ishikawa, I, Okunishi, E, Sawada, H, Okura, Y, Yamazaki, K, Ishikawa, T, Kawazu, M, Hori, M, Terao, M, Kanno, M, Tanba, S, Kondo, Y
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609093829
Date:
July, 2009
File:
PDF, 64 KB
english, 2009
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