Characterization of Nanoscale Structures Using a...

Characterization of Nanoscale Structures Using a Combination of an Ultra-High Resolution Field Emission SEM and Large Area Silicon Drift Detector.

Rowlands, N, Erdman, N, Robertson, V
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609094264
Date:
July, 2009
File:
PDF, 427 KB
english, 2009
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