Characterization of Semiconductor Nanowires by HRTEM and...

Characterization of Semiconductor Nanowires by HRTEM and In-Situ TEM

Wang, N
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Volume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609095221
Date:
July, 2009
File:
PDF, 952 KB
2009
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