Aberration-Corrected STEM Imaging and 2-D...

Microscopy and Microanalysis 2009 / 7 Vol. 15; Iss. S2

Aberration-Corrected STEM Imaging and 2-D Elemental-Resolved Valence-EELS Mapping of Ru-TaN Ultrathin Barrier Layer

Xin, HL, Muller, DA
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609095294
Date:
July, 2009
File:
PDF, 773 KB
english, 2009
Conversion to is in progress
Conversion to is failed