Secondary Electron Grain Contrast Induced by Incident...

Secondary Electron Grain Contrast Induced by Incident Electrons in a Electroplated Copper Thin Film

Demers, H, Lifshin, E
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Volume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609096093
Date:
July, 2009
File:
PDF, 416 KB
2009
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