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In-Situ Electrical Measurements of Vertically Aligned Nanostructures
McMahon, G, Paudel, T, Ren, ZF, Naughton, MJVolume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609097256
Date:
July, 2009
File:
PDF, 555 KB
2009