First Application of Cc Corrected Imaging for...

Microscopy and Microanalysis 2009 / 7 Vol. 15; Iss. S2

First Application of Cc Corrected Imaging for High-Resolution and Energy-Filtered TEM

Kabius, B, Hartel, P, Haider, M, Müller, H, Uhlemann, S, Loebau, U, Zach, J
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609098547
Date:
July, 2009
File:
PDF, 608 KB
english, 2009
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