Aberration-Corrected STEM

Microscopy and Microanalysis 2009 / 7 Vol. 15; Iss. S2

Aberration-Corrected STEM

Bacon, NJ, Corbin, GJ, Dellby, N, Hrncirik, P, Krivanek, O, Murfitt, M, Own, CS, Szilagyi, Z
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609098912
Date:
July, 2009
File:
PDF, 297 KB
english, 2009
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