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Aberration-Corrected STEM
Bacon, NJ, Corbin, GJ, Dellby, N, Hrncirik, P, Krivanek, O, Murfitt, M, Own, CS, Szilagyi, ZVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609098912
Date:
July, 2009
File:
PDF, 297 KB
english, 2009