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Domain Structure Control of BiFeO3 Films Through Substrate Symmetry and Film Thickness
Nelson, CT, Zhang, Y, Folkman, CM, Eom, CB, Mansfield, JF, Pan, XQVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609099450
Date:
July, 2009
File:
PDF, 669 KB
english, 2009