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Advances in EELS Instrumentation: A New Design High-Vacuum Parallel EELS System
Twesten, R, Trevor, C, Barfels, M, Sato, Y, Menon, N, Thomas, P, Gubbens, AVolume:
17
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927611006714
Date:
July, 2011
File:
PDF, 540 KB
2011