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New Results with High Quantum Efficiency Silicon Drift Detectors
Niculae, A, Andricek, L, Bornschlegl, M, Eckhardt, R, Herrmann, J, Jartischin, O, Jeschke, S, Lechner, P, Mungenast, L, Schweinfest, B, Soltau, H, Strüder, LVolume:
17
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927611006891
Date:
July, 2011
File:
PDF, 396 KB
english, 2011