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Three-Dimensional Analysis by Electron Diffraction Methods of Nanocrystalline Materials
Gammer, Christoph, Mangler, Clemens, Karnthaler, Hans-Peter, Rentenberger, ChristianVolume:
17
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927611011962
Date:
December, 2011
File:
PDF, 345 KB
english, 2011