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Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study
Alem, N., Louie, S., Zettl, A., Ramasse, Q., Yazyev, O., Seabourne, C., Scott, A., Kisielowski, C., Hartel, P., Jiang, B., Erni, R.Volume:
18
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927612009439
Date:
July, 2012
File:
PDF, 546 KB
2012