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Precision Limits to STEM Imaging from Dynamical Scattering and Channeling of Sub-Angstrom Electron Probes
Yankovich, Andrew B., Voyles, Paul M.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614002323
Date:
August, 2014
File:
PDF, 1.10 MB
english, 2014