Using Bethe Potentials in the Scattering Matrix for Defect...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Using Bethe Potentials in the Scattering Matrix for Defect Image Simulations

Wang, A., De Graef, M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614006874
Date:
August, 2014
File:
PDF, 1.69 MB
english, 2014
Conversion to is in progress
Conversion to is failed