New insights into reliability of electrostatic capacitive...

International Journal of Microwave and Wireless Technologies 2011 / 10 Vol. 3; Iss. 5

New insights into reliability of electrostatic capacitive RF MEMS switches

Zaghloul, Usama, Papaioannou, George J., Bhushan, Bharat, Coccetti, Fabio, Pons, Patrick, Plana, Robert
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Volume:
3
Language:
english
Journal:
International Journal of Microwave and Wireless Technologies
DOI:
10.1017/s1759078711000766
Date:
October, 2011
File:
PDF, 925 KB
english, 2011
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