Structural stability and Raman scattering of InN nanowires under high pressure
Yao, L.D., Luo, S.D., Shen, X., You, S.J., Yang, L.X., Zhang, S.J., Jiang, S., Li, Y.C., Liu, J., Zhu, K., Liu, Y.L., Zhou, W.Y., Chen, L.C., Jin, C.Q., Yu, R.C., Xie, S.S.Volume:
25
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2010.0290
Date:
December, 2010
File:
PDF, 699 KB
english, 2010