The Effect of Photoexcitation on Formation of Radiation Defects in Si
Mordkovich, V. N., Danilin, A. B., Erokhin, Yu. N., Boldyrev, S. N.Volume:
201
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-201-477
Date:
January, 1990
File:
PDF, 276 KB
english, 1990