![](/img/cover-not-exists.png)
Raman Scattering Characterization of Ultrathin Films of β-SiC
Choo, Ahn Goo, Tlali, Spirit, Jackson, Howard E., Li, J. P., Stecki, Andrew J.Volume:
324
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-324-267
Date:
January, 1993
File:
PDF, 227 KB
english, 1993