Raman Scattering Characterization of Ultrathin Films of...

Raman Scattering Characterization of Ultrathin Films of β-SiC

Choo, Ahn Goo, Tlali, Spirit, Jackson, Howard E., Li, J. P., Stecki, Andrew J.
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Volume:
324
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-324-267
Date:
January, 1993
File:
PDF, 227 KB
english, 1993
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