Trace Analysis of Nanoscale Materials by Analytical...

MRS Proceedings 1994 / 1 Vol. 332

Trace Analysis of Nanoscale Materials by Analytical Electron Microscopy

Newbury, Dale E., Leapman, Richard D.
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Volume:
332
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-332-287
Date:
January, 1994
File:
PDF, 408 KB
english, 1994
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