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Use of a Monte-Carlo Code to Determine in High Z Semi-Conductor CdTe and CZT, Both Carriers Lifetimes and Mobilities
Muller, E., Jung, M., Fougfères, P., Hage-Ali, M., Siffert, P.Volume:
487
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-487-301
Date:
January, 1997
File:
PDF, 421 KB
english, 1997