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Radiation Source Dependence of Degradation in Mosfets on SIMOX Substrate
Hakata, T., Ohyama, H., Simoen, E., Claeys, C., Takami, Y., Kawamura, K., Miyahara, K., Hososhima, M.Volume:
487
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-487-387
Date:
January, 1997
File:
PDF, 350 KB
english, 1997