Effects of Structural Defects on Diode Properties in 4H-SiC
Skromme, B. J., Palle, K. C., Mikhov, M. K., Meidia, H., Mahajan, S., Huang, X. R., Vetter, W. M., Dudley, M., Moore, K., Smith, S., Gehoski, T.Volume:
742
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-742-k3.4
Date:
January, 2002
File:
PDF, 570 KB
english, 2002