Atomic Registry at the Pt-Si Interface Studied by...

Atomic Registry at the Pt-Si Interface Studied by Transmission Channeling RBS

Abelson, John R., Sigmon, Thomas W.
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Volume:
77
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-77-283
Date:
January, 1986
File:
PDF, 430 KB
english, 1986
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