Time-of-Flight Measurements in a-Si:H Between Room Temperature and 130° C°
Shen, D. S., Aljishi, S., Smith, Z E., Conde, J. P., Chu, V., Wagner, S.Volume:
95
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-95-95
Date:
January, 1987
File:
PDF, 313 KB
english, 1987