Quantification of Sample Thickness and In-Concentration of...

Microscopy and Microanalysis 2010 / 10 Vol. 16; Iss. 5

Quantification of Sample Thickness and In-Concentration of InGaAs Quantum Wells by Transmission Measurements in a Scanning Electron Microscope

Volkenandt, T., Müller, E., Hu, D.Z., Schaadt, D.M., Gerthsen, D.
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Volume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927610000292
Date:
October, 2010
File:
PDF, 461 KB
english, 2010
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