Multiple Double Cross-Section Transmission Electron...

Microscopy and Microanalysis 2011 / 12 Vol. 17; Iss. 6

Multiple Double Cross-Section Transmission Electron Microscope Sample Preparation of Specific Sub-10 nm Diameter Si Nanowire Devices

Gignac, Lynne M., Mittal, Surbhi, Bangsaruntip, Sarunya, Cohen, Guy M., Sleight, Jeffrey W.
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Volume:
17
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927611011974
Date:
December, 2011
File:
PDF, 654 KB
english, 2011
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