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Book Review R. L. Snyder, J. Fiala, and H. J. Bunge: “Defect and Microstructure Analysis by Diffraction,” International Union of Crystallography (Oxford University Press, New York, 1999), ISBN 0 19 850189 7.
Šutta, PavolVolume:
15
Language:
english
Journal:
Powder Diffraction
DOI:
10.1017/s0885715600021503
Date:
September, 2000
File:
PDF, 153 KB
english, 2000