Quantitative Transmission Electron Microscopy Analysis of...

Microscopy and Microanalysis 2004 / 4 Vol. 10; Iss. 2

Quantitative Transmission Electron Microscopy Analysis of the Pressure of Helium-Filled Cracks in Implanted Silicon

Tillmann, K., Hüging, N., Trinkaus, H., Luysberg, M.
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604040024
Date:
April, 2004
File:
PDF, 568 KB
english, 2004
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