Off-Axis STEM or TEM Holography Combined with...

Microscopy and Microanalysis 2004 / 2 Vol. 10; Iss. 1

Off-Axis STEM or TEM Holography Combined with Four-Dimensional Diffraction Imaging

Cowley, J.M.
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604040267
Date:
February, 2004
File:
PDF, 131 KB
english, 2004
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