In Situ Reflection Electron Microscopy of Ge Island...

Microscopy and Microanalysis 2004 / 2 Vol. 10; Iss. 1

In Situ Reflection Electron Microscopy of Ge Island Nucleation on Mesa Structures

Ross, F.M., Kammler, M., Walsh, M.E., Reuter, M.C.
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604040334
Date:
February, 2004
File:
PDF, 662 KB
english, 2004
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