Defect Analysis in InGaN/GaN Heterostructures by Combined EDX and CTEM Studies
Sánchez, Ana M, Gass, Mhairi H, Papworth, Adam J, Goodhew, Peter J, Ruterana, PVolume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604881133
Date:
August, 2004
File:
PDF, 120 KB
english, 2004