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Cleaning Treatment to Advance the Quality of FIB Samples for Transmission Electron Microscopy
Gruenewald, Wolfgang, Engelmann, Hans-Juergen, Volkmann, BeateVolume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604881911
Date:
August, 2004
File:
PDF, 1.05 MB
english, 2004