EEL Spectrum Imaging of Extended Defects in Diamond Using UHV Enfina in a Dedicated STEM
Bangert, Uschi, Harvey, Alan J, Jones, Robert, Fall, C J, Papworth, Adam JVolume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604882618
Date:
August, 2004
File:
PDF, 170 KB
english, 2004