Direct 3D (S)TEM Observation at Specific-site and High...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

Direct 3D (S)TEM Observation at Specific-site and High Resolution Using a FIB Micro-sampling Technique

Yaguchi, Toshie, Konno, Mitsuru, Kamino, Takeo, Hashimoto, Takahito, Ohnishi, Tsuyoshi, Umemura, Kaoru
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760488293x
Date:
August, 2004
File:
PDF, 1.97 MB
english, 2004
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