Possibility of Cs-Corrected High-Resolution Electron...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

Possibility of Cs-Corrected High-Resolution Electron Microscopy of CTF of cosχ for Silicon Crystals

Tanaka, Nobuo, Kawai, Tomoykui, Yamasaki, Jun
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604883223
Date:
August, 2004
File:
PDF, 323 KB
english, 2004
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