Hydrogen-Induced Reduction in Medium Range Order of a-Si...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

Hydrogen-Induced Reduction in Medium Range Order of a-Si Thin Films Observed using Fluctuation Electron Microscopy

Nittala, Lakshmi Narayana, Jayaraman, Sreenivas, Sperling, Brent A, Abelson, John R
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604883569
Date:
August, 2004
File:
PDF, 282 KB
english, 2004
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