Silicon Drift Detectors for Fast and High Resolution...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

Silicon Drift Detectors for Fast and High Resolution Element Detection in Micro-Beam Analysis

Soltau, Heike, Lechner, Peter, Lutz, Gerhard, Strüder, Lothar, Fiorini, Carlo, Longoni, Antonio, Eckhard, Rouven, Pahlke, Andreas, Schnecke, Martina, Schaller, Gerhard, Schopper, Florian
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604884009
Date:
August, 2004
File:
PDF, 596 KB
english, 2004
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