3D Materials Characterization using Dual-Beam FIB/SEM...

3D Materials Characterization using Dual-Beam FIB/SEM Techniques

Lee, E, Williams, R, Viswanathan, G B, Banerjee, R, Fraser, H L
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604884204
Date:
August, 2004
File:
PDF, 815 KB
english, 2004
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