Electron Holography with Cs-corrected TEM
Lichte, Hannes, Geiger, Dorin, Lehmann, Michael, Haider, Max, Freitag, BertVolume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604884241
Date:
August, 2004
File:
PDF, 191 KB
english, 2004