TEM Investigation of Interfacial Reactions Between...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

TEM Investigation of Interfacial Reactions Between SrFeO2.5+x Thin Films and Silicon, Sapphire Substrates

Wang, Dashan, Du, Xiaomei, Tunney, James J., Post, Michael L., Gauvin, Raynald
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604884940
Date:
August, 2004
File:
PDF, 415 KB
english, 2004
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