Grafting the FIB Lift-out TEM Sample for Further Ion...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

Grafting the FIB Lift-out TEM Sample for Further Ion Milling

Wang, Nathan, Wu, Jin, Daniel, Sabbas
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604885398
Date:
August, 2004
File:
PDF, 1.17 MB
english, 2004
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