Si Nano-Meshes Investigated Using Transmission Electron...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

Si Nano-Meshes Investigated Using Transmission Electron Microscopy

Lian, G. D., Curtis, M. E., Larson, P. R., Hobbs, K. L., Keay, J. C., Johnson, M. B., Blom, D. A., Allard Jr., L. F.
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604886318
Date:
August, 2004
File:
PDF, 807 KB
english, 2004
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