High Resolution EELS with the Aberration Corrected STEM: Determining Interfacial Electronic Structures with High Accuracy
van Benthem, K., Pennycook, S. J.Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604886380
Date:
August, 2004
File:
PDF, 249 KB
english, 2004