Al and Si Kα: Peaks, Peaking and the Elusive 1% Accuracy in...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

Al and Si Kα: Peaks, Peaking and the Elusive 1% Accuracy in "Common" Minerals

Fournelle, John
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Volume:
10
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604886422
Date:
August, 2004
File:
PDF, 414 KB
2004
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