Composition-Size Diagrams and X-ray Mapping: Complementary...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

Composition-Size Diagrams and X-ray Mapping: Complementary Techniques Used to Understand Sulfur Tolerance in a PtRh Catalyst

Lyman, Charles E., Choi, Sukwon
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604886471
Date:
August, 2004
File:
PDF, 409 KB
english, 2004
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