Approaches and Tools for Analyzing Low-loss EELS Spectra and Spectrum Images
Kundmann, Michael K., Thomas, Paul J., Lourie, Oleg R.Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604886653
Date:
August, 2004
File:
PDF, 160 KB
english, 2004