FIB Specimen Preparation for STEM and EFTEM Tomography

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

FIB Specimen Preparation for STEM and EFTEM Tomography

Schwarz, Stephen M, Giannuzzi, Lucille A
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760488752x
Date:
August, 2004
File:
PDF, 359 KB
english, 2004
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