Environmental Scanning Electron Microscopy on Ultra-thin...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

Environmental Scanning Electron Microscopy on Ultra-thin Films in 2-D and 3-D

Leblanc, R.
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760488783x
Date:
August, 2004
File:
PDF, 475 KB
english, 2004
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